Byung-Eun Park : rechercher sur Z-Library

Journal:

YOON, JOO-WON, SONG, YOUNG-UK, PARK, BYUNG-EUN, KIM, CHUL-JU

Année:

2003

Langue:

english

Fichier:

PDF, 124 KB

english, 2003

FORMATION OF (Bi,La) 4 Ti 3 O 12 FILMS ON Si(100) SUBSTRATES USING ZrO 2 BUFFER LAYERS

Journal:

Park, Byung-Eun, Ishiwara, H.

Année:

2005

Langue:

english

Fichier:

PDF, 1.40 MB

english, 2005

Fabrication of MFIS diodes using sol-gel derived SBT films and LaAlO 3 buffer layers

Journal:

Sarinanto, Mohammad Mustafa, Imada, Shogo, Shoriki, Shigeto, Park, Byung-Eun, Tokumitsu, Eisuke, Ishiwara, Hiroshi

Année:

2001

Langue:

english

Fichier:

PDF, 413 KB

english, 2001

Tem observation of ferroelectric films grown on silicon using Y 2 O 3 buffer layer

Journal:

Année:

1999

Langue:

english

Fichier:

PDF, 1.14 MB

english, 1999

Formation of Silicate-Added (Bi,La) 4 Ti 3 O 12 Films on LaAlO 3 /Si(100) Structures

Journal:

TABUCHI, YOSHIAKI, PARK, BYUNG-EUN, AIZAWA, KOUZI, KAWASHIMA, YOSHIHITO, TAKAHASHI, KAZUHIRO, KATO, KAZUMI, ARIMOTO, YOSHIHIRO, ISHIWARA, HIROSHI

Année:

2003

Langue:

english

Fichier:

PDF, 185 KB

english, 2003

Formation of Ferroelectric (Bi, Nd) 4 Ti 3 O 12 Thin Films on HfO 2 /Si(100) Structures for MFIS-type Ferroelectric Memory Applications

Journal:

Année:

2004

Langue:

english

Fichier:

PDF, 365 KB

english, 2004

FABRICATION AND CHARACTERIZATION OF MFIS-FET USING Bi 3.25 La 0.75 Ti 3 O 12 /ZrO 2 /Si STRUCTURE

SONG, YOUNG-UK, PARK, JUN-SEO, YOON, JOO-WON, LEE, GWANG-GEUN, PARK, BYUNG-EUN, KIM, CHUL-JU, CHOI, YUN-SOO, KOH, JUNE-HWAN

Journal:

Année:

2006

Langue:

english

Fichier:

PDF, 1.27 MB

english, 2006

CHARACTERIZATION OF METAL-FERROELECTRIC-SEMICONDUCTOR STRUCTURE USING FERROELECTRIC POLYMER POLYVINYLIDENE FLUORIDE-TRIFLUOROETHYLENE (PVDF-TrFE) (51/49)

Kim, Dong-Won, Kim, Jeong-Hwan, Kim, Joo-Nam, Park, Hyung-Jin, Jeon, Ho-Seung, Park, Byung-Eun

Journal:

Année:

2008

Langue:

english

Fichier:

PDF, 878 KB

english, 2008

Fabrication of 1K-Bit 1T2C-Type Ferroelectric Memory Cell Array

Yamamoto, Shuu'ichirou, Ishikawa, Toru, Fuchikami, Takaaki, Kim, Hyun-Soo, Aizawa, Kouji, Park, Byung-Eun, Furukawa, Taisuke, Ohki, Hiroshi, Kikuchi, Shin, Hoko, Hiromasa, Ishiwara, Hiroshi

Journal:

PARK, BYUNG-EUN, ISHIWARA, HIROSHI

Année:

2004

Langue:

english

Fichier:

PDF, 818 KB

english, 2004

Fabrication and Characterization of (Bi,La) 4 Ti 3 O 12 Films Using LaAlO 3 Buffer Layers for MFIS Structures

Journal:

Park, Byung-Eun, Ishiwara, H.

Année:

2004

Fichier:

PDF, 611 KB

2004

Fabrication of PZT films on SI substrates by SOL-GEL method using Y 2 O 3 buffer layers

Journal:

Park, Byung-Eun, Ishiwara, Hiroshi, Okuyama, Masanori, Sakai, Shigeki, Yoon, Sung-Min

Année:

2001

Langue:

english

Fichier:

PDF, 613 KB

english, 2001

[Topics in Applied Physics] Ferroelectric-Gate Field Effect Transistor Memories Volume 131 ||

Année:

2016

Langue:

english

Fichier:

PDF, 17.54 MB

english, 2016

[Topics in Applied Physics] Ferroelectric-Gate Field Effect Transistor Memories Volume 131 (Device Physics and Applications) ||

Park, Byung-Eun, Ishiwara, Hiroshi, Okuyama, Masanori, Sakai, Shigeki, Yoon, Sung-Min

Année:

2020

Langue:

english

Fichier:

PDF, 23.59 MB

english, 2020

Hysteresis characteristics of vacuum-evaporated ferroelectric PbZr0.4Ti0.6O3 films on Si(111) substrates using CeO2 buffer layers

Byung-Eun Park, Ikuo Sakai, Eisuke Tokumitsu, Hiroshi Ishiwara

Journal:

Applied Surface Science

Année:

1997

Langue:

english

Fichier:

PDF, 434 KB

english, 1997

Ferroelectric properties of SrBi2Ta2O9thin films on Si (100) with a LaZrOxbuffer layer

Jong-Hyun Im, Ho-Seung Jeon, Joo-Nam Kim, Dong-Won Kim, Byung-Eun Park, Chul-Ju Kim

Journal:

Journal of Electroceramics

Année:

2009

Langue:

english

Fichier:

PDF, 323 KB

english, 2009

Fabrication and characterization of Au/SBT/LZO/Si MFIS structure

Jong-Hyun Im, Ho-Seung Jeon, Joo-Nam Kim, Jeong-Hwan Kim, Gwang-Geun Lee, Byung-Eun Park, Chul-Ju Kim

Journal:

Journal of Electroceramics

Année:

2009

Langue:

english

Fichier:

PDF, 277 KB

english, 2009

Improvement of Electric and Optical Properties of a Reflective Electronic Display by Particle-Moving Method

Dong-Jin Lee, Yoo-Mi Oh, Sun-Woo Park, Byung-Eun Park, Young-Cho Kim

Journal:

Journal of Display Technology

Année:

2012

Langue:

english

Fichier:

PDF, 723 KB

english, 2012

Electrical properties of LaAlO[sub 3]/Si and Sr[sub 0.8]Bi[sub 2.2]Ta[sub 2]O[sub 9]/LaAlO[sub 3]/Si structures

Han, Seung Pil, Suga, Kosaku, Fujihira, Masamichi, Park, Byung-Eun

Journal:

Applied Physics Letters

Année:

2001

Langue:

english

Fichier:

PDF, 220 KB

english, 2001

Novel tip modification method for measurement of the adhesive force between a silanized surface and a locally modified tip using atomic force microscopy

Journal:

Journal of the Korean Physical Society

Année:

2014

Langue:

english

Fichier:

PDF, 289 KB

english, 2014

BLT/STA/Si Structure for MFIS in an NDRO-Type Ferroelectric Random Access Memory

Jeon, Ho-Seung, Park, Kwang-Hun, Park, Byung-Eun, Kim, Chul-Ju, Choi, Yun-Soo

Journal:

Aizawa, Koji, Park, Byung-Eun, Kawashima, Yoshihito, Takahashi, Kazuhiro, Ishiwara, Hiroshi

Année:

2007

Langue:

english

Fichier:

PDF, 534 KB

english, 2007

[IEEE 2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics - Nara-city, Japan (2007.05.27-2007.05.31)] 2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics - Structural and Electrical Properties of Ferroelectric-Gate Field-Effect-Transistors Using Au/(Bi,La)4Ti3O12/SrTa2O6/Si Structures

Jeon, Ho-Seung, Kim, Jeong-Hwan, Kim, Joo-Nam, Park, Kwang-Hun, Park, Byung-Eun

Année:

2007

Langue:

english

Fichier:

PDF, 2.76 MB

english, 2007

Impact of HfO[sub 2] buffer layers on data retention characteristics of ferroelectric-gate field-effect transistors

Journal:

Applied Physics Letters

Année:

2004

Langue:

english

Fichier:

PDF, 339 KB

english, 2004

Electrical Properties of Au/(Bi,La)4Ti3O12/Pt/SrTa2O6/Si Field-Effect Transistor

Kim, Joo-Nam, Jeon, Ho-Seong, Park, Byung-Eun

Journal:

Park, Byung-Eun, Takahashi, Kazuhiro, Ishiwara, Hiroshi

Année:

2009

Langue:

english

Fichier:

PDF, 610 KB

english, 2009

Five-day-long ferroelectric memory effect in Pt∕(Bi,La)[sub 4]Ti[sub 3]O[sub 12]∕HfO[sub 2]∕Si structures

Journal:

Applied Physics Letters

Année:

2004

Langue:

english

Fichier:

PDF, 247 KB

english, 2004

Thin Film Properties of Sol-Gel Derived High-K Lanthanum-Doped Zirconium Oxides

Jeon, Ho-Seung, Kim, Joo-Nam, Lee, Gwang-Geun, Choi, Yun-Soo, Park, Byung-Eun

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 1.81 MB

english, 2009

Formation of (Bi,La) 4 Ti 3 O 12 Films on Si(100) Substrates Using LaAlO 3 Buffer Layers

Journal:

HAN, HUI-SEONG, LEE, GWANG-GEUN, PARK, BYUNG-EUN

Année:

2003

Langue:

english

Fichier:

PDF, 111 KB

english, 2003

FABRICATION AND ELECTRICAL PROPERTIES OF Au/PVDF-TrFE/LaZrO x /Si(100) STRUCTURE

Journal:

International Journal of Modern Physics B

Année:

2010

Langue:

english

Fichier:

PDF, 346 KB

english, 2010

Measurement of the interaction forces at various pH levels by using AFM for the interpretation of DNA adsorption on silanized surfaces

Han, Seung Pil, Suga, Kosaku, Fujihara, Masamichi, Park, Byung-Eun

Journal:

Journal of the Korean Physical Society

Année:

2014

Langue:

english

Fichier:

PDF, 353 KB

english, 2014

Thirty-Day-Long Data Retention in Ferroelectric-Gate Field-Effect Transistors with HfO 2 Buffer Layers

Takahashi, Kazuhiro, Aizawa, Koji, Park, Byung-Eun, Ishiwara, Hiroshi

Journal:

Japanese Journal of Applied Physics

Année:

2005

Langue:

english

Fichier:

PDF, 158 KB

english, 2005

Fabrication of PbZr x Ti 1- x O 3 Films on Si Structures Using Y 2 O 3 Buffer Layers

Park, Byung-Eun, Shouriki, Shigeto, Tokumitsu, Eisuke, Ishiwara, Hiroshi

Journal:

Japanese Journal of Applied Physics

Année:

1998

Langue:

english

Fichier:

PDF, 161 KB

english, 1998

Fabrication and Electrical Characteristics of P(VDF-TrFE) Films on Si(100) Substrates Using Cyanoethyl Pullulan Buffer Layers

Jin, Bo, Kim, Min-Gee, Park, Byung-Eun

Journal:

Année:

2015

Langue:

english

Fichier:

PDF, 593 KB

english, 2015

Fabrication and Characterization of MFIS-FET Using Au/BLT/LZO/Si Structures

Jeon, Ho-Seung, Lee, Gwang-Geun, Kim, Jeong-Hwan, Kim, Joo-Nam, Choi, Yun-Soo, Park, Byung-Eun

Journal: